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On-Chip Electrostatically Actuated Bending Tests for the Mechanical Characterization of Polysilicon at the Micro Scale

✍ Scribed by Alberto Corigliano; Fabrizio Cacchione; Biagio De Masi; Caterina Riva


Book ID
106461184
Publisher
Springer Netherlands
Year
2005
Tongue
English
Weight
677 KB
Volume
40
Category
Article
ISSN
0025-6455

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