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On background: using two-argument chance

โœ Scribed by Kevin Nelson


Publisher
Springer Netherlands
Year
2007
Tongue
English
Weight
233 KB
Volume
166
Category
Article
ISSN
0039-7857

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## Abstract Acquisition of a great number of energyโ€filtered images in a TEM (EFTEM) around the characteristic signal with a low energyโ€selecting slit allows display of the electron energy loss (EEL)โ€spectrum of regions of interest (ROIs) of a sample. These EELโ€spectra can be submitted to the diffe