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On application of interference of millimeter and submillimeter waves for diagnostics of photoconductivity depth distribution in semiconductor wafers

✍ Scribed by O. G. Koshelev; E. A. Guseva

Book ID: 107561699
Publisher: Allerton Press Inc
Year: 2008
Tongue: English
Weight: 188 KB
Volume: 72
Category: Article
ISSN: 1062-8738
DOI: 10.1007/s11954-008-1025-4

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