On a basic equation of reliability theory : F. Beichelt and K. Fischer. Microelectron. Reliab.19, 367 (1979)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 134 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90084-0