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Omega-Scan: an X-ray tool for the characterization of crystal properties

✍ Scribed by Hans Berger; Hans-Arthur Bradaczek; Hans Bradaczek

Publisher: Springer US
Year: 2007
Tongue: English
Weight: 452 KB
Volume: 19
Category: Article
ISSN: 0957-4522
DOI: 10.1007/s10854-007-9479-y

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