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Ohmic Heating of InGaN LEDs during Operation: Determination of the Junction Temperature and Its Influence on Device Performance

✍ Scribed by Schwegler, V. ;Schad, S. S. ;Kirchner, C. ;Seyboth, M. ;Kamp, M. ;Ebeling, K. J. ;Kudryashov, V. E. ;Turkin, A. N. ;Yunovich, A. E. ;Stempfle, U. ;Link, A. ;Limmer, W. ;Sauer, R.


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
120 KB
Volume
176
Category
Article
ISSN
0031-8965

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