✦ LIBER ✦
Off-state breakdown effects on gate leakage current in power pseudomorphic AlGaAs/InGaAs HEMTs
✍ Scribed by Chou, Y.C.; Li, G.P.; Chen, Y.C.; Wu, C.S.; Yu, K.K.; Midford, T.A.
- Book ID
- 120005705
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 295 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0741-3106
No coin nor oath required. For personal study only.