✦ LIBER ✦
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip
✍ Scribed by Kihyuk Han; Joonsung Park; Jae Wook Lee; Jaeyong Chung; Eonjo Byun; Cheol-Jong Woo; Sejang Oh; Jacob A. Abraham
- Book ID
- 106384533
- Publisher
- Springer US
- Year
- 2011
- Tongue
- English
- Weight
- 713 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0923-8174
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