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Observations on crystal defects associated with diffusion induced grain boundary migration in CuZn

✍ Scribed by S.A. Hackney; F.S. Biancaniello; D.N. Yoon; C.A. Handwerker

Book ID
116062450
Publisher
Elsevier Science
Year
1986
Weight
788 KB
Volume
20
Category
Article
ISSN
0036-9748

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AbstractÐDiusion induced grain boundary migration (DIGM) in the Cu(Zn) system was experimentally studied by Li and Hillert using polycrystalline Cu specimens zinci®ed with binary Cu±Zn alloys containing 3.9±30.5 wt% of Zn at temperatures between 573 and 773 K. Their experimental results have been qu