Observations of EE dislocations using Sirtl etchant and their influence on transistor parameters

✍ Scribed by P.C. Parekh; E. Gavel; V. Lyn

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 257 KB
• Volume: 13
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(70)90148-6