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Observations of crystal orientation effects in tin-telluride thin films

✍ Scribed by S.R. Shortes; D.P. Miller


Publisher
Elsevier Science
Year
1961
Tongue
English
Weight
309 KB
Volume
11
Category
Article
ISSN
0042-207X

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## Abstract Atomic force microscopy (AFM) was used for modifying the surface structures of poly(__Ξ΅__‐caprolactone) (PCL) thin film. Oriented growth of PCL crystals at a desired area of the film surface was induced by scanning with a strong, normal load. PCL crystals were first grown edge‐on from t