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Observation of the Microstructure of Grain Boundary Oxides in Superconducting RF-Quality Niobium With High-Resolution TEM (Transmission Electron Microscope)
✍ Scribed by Sung, Z-H; Lee, P. J.; Larbalestier, D. C.
- Book ID
- 121656669
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 450 KB
- Volume
- 24
- Category
- Article
- ISSN
- 1051-8223
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