✦ LIBER ✦
Observation of suppressed interface state relaxation under positive gate biasing of the ultrathin oxynitride gate p-MOSFET subjected to negative-bias temperature stressing
✍ Scribed by D. Ang
- Book ID
- 126702626
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 111 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0741-3106
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