Observation of Si nanocrystals in a/nc-Si:H films by spherical-aberration corrected transmission electron microscopy

✍ Scribed by Christopher R. Perrey; Siri Thompson; Markus Lentzen; Uwe Kortshagen; C. Barry Carter

• Book ID: 116667924
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 695 KB
• Volume: 343
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2004.06.013