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Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy

✍ Scribed by Qinghui Li; Fuxi Gan


Book ID
108417495
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
478 KB
Volume
181
Category
Article
ISSN
0169-4332

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In-Situ Atomic Force Microscopy Observat
✍ Yoshihiro Kikkawa; Takuya Hirota; Keiji Numata; Takeharu Tsuge; Hideki Abe; Tada πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 327 KB

## Abstract **Summary:** The enzymatic degradation of lamellar crystals in poly(hydroxyalkanoic acid) thin films has been visualized by using in‐situ dynamic force mode (tapping mode) atomic force microscopy (AFM) in buffer solution. It was found that poly(hydroxybutyric acid) (PHB) depolymerase fr