X-ray photoelectron spectroscopy (XPS) is a surface sensitive analytical technique that measures the binding energy of electrons in atoms and molecules on the surface of a material. XPS was used to determine the distribution of the oligosaccharide side chains in the glycoprotein, MUC1 mucin. Low-res
Observation of polymorphic lead monoxide surfaces using x-ray photoelectron spectroscopy
β Scribed by K.S. Kim; N. Winograd
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 364 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0009-2614
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β¦ Synopsis
The X-ray photoelectron spectra of several lead-oxygen species are reported. During the oxidation of freshly cvaporated lead surfaces, chemisorbed osygen atoms on lead as uell as rhombic and tetragonal PbO c&i be detected.
The unique sensitivity of 0 1s spectra to the different crystal modifications has also allowed the mcnitoring of a polymorphic transformation on oxide films as thin as a monolayer.
π SIMILAR VOLUMES
Electrical charging of insulating samples during XPS is of direct concern for referencing the binding energy scale. Results are presented on charging of composite insulating samples that consist of an organic overlayer of polystyrene (PS) or polydimethylsiloxane (PDMS) deposited on NaCl particles. T
Total reΓection x-ray photoelectron spectroscopy (TRXPS) has been applied to measure contamination elements on Si wafers using an x-ray photoelectron spectrometer. The radiated x-rays are limited by a slit placed in front of the Al anode, and the grazing angle is made shallow by using a crystal to m
Differential sample charging is a potential problem in x-ray photoelectron spectroscopic studies of insulating or partially conducting materials, especially when monochromatic x-radiation is used. The phenomenon can be exploited to distinguish between compounds that do not exhibit a significant chem