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Observation of molecular reorientations in vapor-deposited organic thin films during heat treatment by energy-dispersive total-reflection X-ray diffractometry

✍ Scribed by Kouichi Hayashi; Kenji Ishida; Toshihisa Horiuchi; Kazumi Matsushige


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
530 KB
Volume
245
Category
Article
ISSN
0040-6090

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