Observation of Misfit Dislocation Strain-Induced Surface Features for a Si/Ge-Si Heterostructure Using Total Reflection X-Ray Topography

✍ Scribed by McNally, P.J. ;Dilliway, G. ;Bonar, J.M. ;Willoughby, A. ;Tuomi, T. ;Rantam�ki, R. ;Danilewsky, A.N. ;Lowney, D.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 157 KB
• Volume: 180
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200007)180:1<r1::aid-pssa99991>3.0.co;2-b

✦ Synopsis

a), G. Dilliway (b), J.M. Bonar (b), A. Willoughby (b), T. Tuomi (c), R Rantama Èki (c), A.N. Danilewsky (d), and D. Lowney (a)