Observation of memory effect in germanium nanocrystals embedded in an amorphous silicon oxide matrix of a metal–insulator– semiconductor structure

✍ Scribed by Choi, W. K.; Chim, W. K.; Heng, C. L.; Teo, L. W.; Ho, Vincent; Ng, V.; Antoniadis, D. A.; Fitzgerald, E. A.

• Book ID: 126959556
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 467 KB
• Volume: 80
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1459760