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Observation of High-Aspect-Ratio Nanostructures Using Capillary Lithography

✍ Scribed by K. Y. Suh; S.-J. Choi; S. J. Baek; T. W. Kim; R. Langer

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 360 KB
Volume: 17
Category: Article
ISSN: 0935-9648
DOI: 10.1002/adma.200401089

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