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Observation of electron diffraction due to a reflection grating in an electron wave transistor

✍ Scribed by K.W. Park; S. Lee; M. Shin; J.S. Yuk; E.-H. Lee; H.C. Kwon

Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 99 KB
Volume: 25
Category: Article
ISSN: 0749-6036
DOI: 10.1006/spmi.1998.0629

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✦ Synopsis

We investigate quantum transport in the presence of an electron reflection grating fabricated in an electron wave transistor structure. The grating is made up of a periodically corrugated potential wall by which the electron waves are coherently scattered. We observe a number of peaks with respect to the gate voltage in the low-temperature conductance measurements. The conductance oscillations are attributed to the electron diffraction effect, and the peak positions agree well with those predicted by the Fraunhofer diffraction condition.

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