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Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy

✍ Scribed by Do, L. M.; Han, E. M.; Niidome, Y.; Fujihira, M.; Kanno, T.; Yoshida, S.; Maeda, A.; Ikushima, A. J.

Book ID: 121257601
Publisher: American Institute of Physics
Year: 1994
Tongue: English
Weight: 789 KB
Volume: 76
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.357224

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