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Observation of chemical shifts of Si 2p level by an x-ray photoelectron spectroscopy system with a laser-plasma x-ray source

✍ Scribed by Kondo, Hiroyuki; Tomie, Toshihisa; Shimizu, Hideaki

Book ID: 115488301
Publisher: American Institute of Physics
Year: 1998
Tongue: English
Weight: 292 KB
Volume: 72
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.121093

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