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Observation of a bistable defect generated and activated by heat treatments in irradiated high resistivity silicon detectors

✍ Scribed by M. Moll; H. Feick; E. Fretwurst; G. Lindström; T. Schulz


Book ID
114289435
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
436 KB
Volume
44
Category
Article
ISSN
0920-5632

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