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Observation and measurement of temperature rise and distribution on GaAs photo-cathode wafer with a 532 nm drive laser and a thermal imaging camera

✍ Scribed by S. Zhang; S.V. Benson; C. H-Garcia


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
855 KB
Volume
631
Category
Article
ISSN
0168-9002

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