Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy

✍ Scribed by Palleau, E; Ressier, L; Borowik, Ł; Mélin, T

• Book ID: 120489833
• Publisher: Institute of Physics
• Year: 2010
• Tongue: English
• Weight: 706 KB
• Volume: 21
• Category: Article
• ISSN: 0957-4484
• DOI: 10.1088/0957-4484/21/22/225706