Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy−SECM Probes Using the Boundary Element Method

✍ Scribed by Sklyar, Oleg; Kueng, Angelika; Kranz, Christine; Mizaikoff, Boris; Lugstein, Alois; Bertagnolli, Emmerich; Wittstock, Gunther

• Book ID: 120884028
• Publisher: American Chemical Society
• Year: 2005
• Tongue: English
• Weight: 290 KB
• Volume: 77
• Category: Article
• ISSN: 0003-2700
• DOI: 10.1021/ac048732n