✦ LIBER ✦
Numerical simulation of hot-electron effects on source-drain burnout characteristics of GaAs power FETs : F. A. Buot and K. J. Sleger. Solid-St. Electron. 27, 1067 (1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 133 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
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