✦ LIBER ✦
Numerical simulation of creation-passivation kinetics of interface traps in irradiated n-channel power VDMOSFETs during thermal annealing with various gate biases
✍ Scribed by Goran S. Ristić; Momčilo M. Pejović; Aleksandar B. Jakšić
- Book ID
- 104306475
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 164 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0167-9317
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