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Numerical modeling of crossover and other junction discontinuities in two-layer microstrip circuits

✍ Scribed by Hoorfar, Ahmad ;Zheng, J. X. ;Chang, David C.

Publisher: John Wiley and Sons
Year: 1992
Tongue: English
Weight: 821 KB
Volume: 2
Category: Article
ISSN: 1050-1827
DOI: 10.1002/mmce.4570020408

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✦ Synopsis

Abstract

A mixed‐potential, spatial‐domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. A Galerkin method, together with the so‐called pseudo‐mesh current distribution for the basis functions, is then applied to accurately characterize multiport junctions. As an example, a four‐port crossover of two microstrip transmission lines is characterized in terms of the S‐parameters. © 1992 John Wiley & Sons, Inc.

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