A numerical study of chaos in transferre
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H. R. Farrah; M. P. Shaw
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Article
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1996
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John Wiley and Sons
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English
โ 458 KB
๐ 3 views
A model of a transferred electron device including reactive circuit elements and realistic boundary conditions is used to study chaos. We find that any simulation of chaos is suspect if the external circuit and cathode bounda ry conditions are ignored; including them reduces the range ofparameters i