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Numerical analysis on determining the physical mechanisms contributing to the abnormal base current in post-burn-in AlGaAs/GaAs HBTs

✍ Scribed by S Sheu; J.J Liou; C.I Huang


Book ID
108362222
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
407 KB
Volume
38
Category
Article
ISSN
0026-2714

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