𝔖 Bobbio Scriptorium
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Null ellipsometer with phase modulation

✍ Scribed by Postava, K.; Maziewski, A.; Yamaguchi, T.; Ossikovski, R.; Visnovský, S.; Pistora, J.


Book ID
115404578
Publisher
Optical Society of America
Year
2004
Tongue
English
Weight
306 KB
Volume
12
Category
Article
ISSN
1094-4087

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An Off-Null Ellipsometer with Lateral Sc
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A null ellipsometer was equipped with an automatic sample scanning device and used for the measurement of adsorption and desorption of proteins at the liquid/solid interface on surface wettability gradients on silicon wafers. To follow the processes along the wettability gradient, "off-null" ellipso