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Nucleation and growth analysis of microcrystalline silicon by scanning probe microscopy: substrate dependence, local structural and electronic properties of as-grown surfaces

✍ Scribed by Ch Ross; J Herion; H Wagner


Book ID
117150269
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
361 KB
Volume
266-269
Category
Article
ISSN
0022-3093

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