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[Novisibirsk State Tech. Univ IEEE - Russia Conference. 1999 High Power Microwave Electronics: Measurements, Identification, Applications - Novosibirsk, Russia (21-23 Sept. 1999)] Proceedings of the IEEE - Russia Conference. 1999 High Power Microwave Electronics: Measurements, Identification, Applications. MIA-ME'99 (Cat. No.99EX289) - The effect of thermal annealing on the properties of polysilicon piezoresistors

✍ Scribed by Gridchin, V.A.; Grischenko, V.V.; Loganihin, A.M.; Lubimsky, V.M.

Book ID: 118264690
Publisher: Novisibirsk State Tech. Univ
Year: 1999
Tongue: Russian
Weight: 252 KB
Edition: 1999
Volume: 0
Category: Article
ISBN-13: 9785778202702
DOI: 10.1109/miame.1999.827838

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