𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Novel x-ray mask distortion measurement technique employing holographic gratings and phase-shifting interferometry: Hansen, M. E.; Chen, H. T. H.; Engelstad, R. L.; Cerrina, F. Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena - Symposium on electron, ion and photon beams. 1992 Nov; 10(6)


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
269 KB
Volume
16
Category
Article
ISSN
0141-6359

No coin nor oath required. For personal study only.