Novel technique for the systematic measurement of gain, absolute refractive index spectra, and other parameters of semiconductor lasers

✍ Scribed by Wu, L.; Fu, L.

• Book ID: 117869612
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 225 KB
• Volume: 36
• Category: Article
• ISSN: 0018-9197
• DOI: 10.1109/3.845729