𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Novel technique for measuring through-plane modulus in thin polymer films

✍ Scribed by Patel, K.S.; Kohl, P.A.; Bidstrup-Allen, S.A.


Book ID
114561980
Publisher
IEEE
Year
1998
Tongue
English
Weight
128 KB
Volume
21
Category
Article
ISSN
1070-9894

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Dual capacitor technique for measurement
✍ Kaushal S. Patel; Paul A. Kohl; Sue Ann Bidstrup Allen πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 194 KB πŸ‘ 2 views

Polymer thin films are widely used as coatings and interlevel dielectrics in microelectronic applications. In thin-film structures, stresses are generated due to interaction with adjacent layers and film shrinkage due to solvent evaporation or curing. This causes polymer chain orientation resulting

Laser interferometry: A measurement tech
✍ K. L. Saenger; H. M. Tong πŸ“‚ Article πŸ“… 1991 πŸ› Society for Plastic Engineers 🌐 English βš– 403 KB

## Abstract Laser interferometric techniques have many applications in the area of thin film science and technology due to their sensitivity, simplicity, and low cost. Typically, changes in thickness and/or refractive index of a transparent polymer film sample are detected from changes in film refl