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Novel near-field probe for on-wafer integrated circuit measurements

✍ Scribed by G.E. Bridges; T.S. Forzley; D.J. Thomson

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 422 KB
Volume: 23
Category: Article
ISSN: 0026-2692
DOI: 10.1016/0026-2692(92)90114-g

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