✦ LIBER ✦
Novel low-temperature C-V technique for MOS doping profile determination near the Si/SiO2 interface
✍ Scribed by Pirovano, A.; Lacaita, A.L.; Pacelli, A.; Benvenuti, A.
- Book ID
- 114538630
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 173 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.