✦ LIBER ✦
Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology
✍ Scribed by Guo, Jing; Xiao, Liyi; Mao, Zhigang
- Book ID
- 121654716
- Publisher
- Institute of Electrical and Electronics Engineers
- Year
- 2014
- Tongue
- English
- Weight
- 918 KB
- Volume
- 61
- Category
- Article
- ISSN
- 1549-8328
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