Novel form birefringence modeling for an ultracompact sensor in porous silicon films using polarization interferometry

✍ Scribed by Beom-hoan O; Chul-Hyun Choi; Soo-Beom Jo; Min-Woo Lee; Dong-Gue Park; Byeong-Gwon Kang; Sun-Hyung Kim; Rong Liu; Yang Yang Li; M.J. Sailor; Y. Fainman

• Book ID: 119800842
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 380 KB
• Volume: 16
• Category: Article
• ISSN: 1041-1135
• DOI: 10.1109/lpt.2003.821096