✦ LIBER ✦
Novel combination of orientation measurements and transmission microscopy for experimental determination of grain boundary miller indices in silicon and other semiconductors
✍ Scribed by C. FUNKE; T. BEHM; R. HELBIG; E. SCHMID; S. WÜRZNER
- Book ID
- 108866971
- Publisher
- John Wiley and Sons
- Year
- 2012
- Tongue
- English
- Weight
- 865 KB
- Volume
- 246
- Category
- Article
- ISSN
- 0022-2720
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