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Novel combination of orientation measurements and transmission microscopy for experimental determination of grain boundary miller indices in silicon and other semiconductors

✍ Scribed by C. FUNKE; T. BEHM; R. HELBIG; E. SCHMID; S. WÜRZNER


Book ID
108866971
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
865 KB
Volume
246
Category
Article
ISSN
0022-2720

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