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๐Ÿ“

Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials

โœ Scribed by Yoshio Waseda (eds.)


Publisher
Springer-Verlag Berlin Heidelberg
Year
1984
Tongue
English
Leaves
190
Series
Lecture Notes in Physics 204
Edition
1
Category
Library

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โœฆ Table of Contents


A brief background of the present requirement for structural characterization of disordered materials....Pages 1-3
Fundamental relationships between rdf and scattering intensity....Pages 4-9
Definition of partial structure factors and compositional short range order (CSRO)....Pages 10-19
Experimental determination of partial structural functions....Pages 20-24
Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials....Pages 25-31
Theoretical aspects on the anomalous dispersion factors of x-rays....Pages 32-39
Experimental determination of the anomalous dispersion factors....Pages 40-46
Selected examples of structural determination using anomalous (resonance) x-ray scattering....Pages 47-90
Relative merits of anomalous x-ray scattering and its future prospects....Pages 91-98

โœฆ Subjects


Crystallography


๐Ÿ“œ SIMILAR VOLUMES


Anomalous X-Ray Scattering for Material
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<p>The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous disper

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The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersio