Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials
โ Scribed by Yoshio Waseda (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 1984
- Tongue
- English
- Leaves
- 190
- Series
- Lecture Notes in Physics 204
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Table of Contents
A brief background of the present requirement for structural characterization of disordered materials....Pages 1-3
Fundamental relationships between rdf and scattering intensity....Pages 4-9
Definition of partial structure factors and compositional short range order (CSRO)....Pages 10-19
Experimental determination of partial structural functions....Pages 20-24
Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials....Pages 25-31
Theoretical aspects on the anomalous dispersion factors of x-rays....Pages 32-39
Experimental determination of the anomalous dispersion factors....Pages 40-46
Selected examples of structural determination using anomalous (resonance) x-ray scattering....Pages 47-90
Relative merits of anomalous x-ray scattering and its future prospects....Pages 91-98
โฆ Subjects
Crystallography
๐ SIMILAR VOLUMES
<p>The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous disper
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