Normal incidence detector using Ge quantum-well structures grown on Si (100)

✍ Scribed by Lee, C.; Chun, S.K.; Wang, K.L.

• Book ID: 114535334
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 265 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.239829