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Nonparametric Accelerated Life Testing

✍ Scribed by Basu, A.P.; Ebrahimi, Nader

Book ID: 117934725
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 609 KB
Volume: R-31
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.1982.5221417

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