✦ LIBER ✦
Nonlinear statistical modeling and yield estimation technique for use in Monte Carlo simulations [microwave devices and ICs]
✍ Scribed by Swidzinski, J.F.; Kai Chang
- Book ID
- 114553920
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 255 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9480
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