Noninvasive Semiconductor Field Imaging: Imaging the Electric-Field Distribution in Organic Devices by Confocal Electroreflectance Microscopy (Adv. Funct. Mater. 8/2009)

✍ Scribed by Michele Celebrano; Calogero Sciascia; Giulio Cerullo; Margherita Zavelani-Rossi; Guglielmo Lanzani; Juan Cabanillas-Gonzalez

• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 275 KB
• Volume: 19
• Category: Article
• ISSN: 1616-301X
• DOI: 10.1002/adfm.200990028