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Nondestructive screening for low voltage failure in multilayer ceramic capacitors : Robert C. Chittick, Edmund Gray, John H. Alexander, Miles P. Drake and Eric L. Bush. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 510 (December 1983)


Book ID
103281129
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
134 KB
Volume
24
Category
Article
ISSN
0026-2714

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