𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Nondestructive Readout of Ferroelectric-Gate Field-Effect Transistor Memory With an Intermediate Electrode by Using an Improved Operation Method

✍ Scribed by Horita, S.; Trinh, B.


Book ID
114619165
Publisher
IEEE
Year
2008
Tongue
English
Weight
722 KB
Volume
55
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.